International Science Index

10
10007406
Design of Parity-Preserving Reversible Logic Signed Array Multipliers
Abstract:
Reversible logic as a new favorable design domain can be used for various fields especially creating quantum computers because of its speed and intangible power consumption. However, its susceptibility to a variety of environmental effects may lead to yield the incorrect results. In this paper, because of the importance of multiplication operation in various computing systems, some novel reversible logic array multipliers are proposed with error detection capability by incorporating the parity-preserving gates. The new designs are presented for two main parts of array multipliers, partial product generation and multi-operand addition, by exploiting the new arrangements of existing gates, which results in two signed parity-preserving array multipliers. The experimental results reveal that the best proposed 4×4 multiplier in this paper reaches 12%, 24%, and 26% enhancements in the number of constant inputs, number of required gates, and quantum cost, respectively, compared to previous design. Moreover, the best proposed design is generalized for n×n multipliers with general formulations to estimate the main reversible logic criteria as the functions of the multiplier size.
Paper Detail
66
downloads
9
8200
A Review of in-orbit Observations of Radiation- Induced Effects in Commercial Memories onboard Alsat-1
Abstract:

This paper presents a review of an 8-year study on radiation effects in commercial memory devices operating within the main on-board computer system OBC386 of the Algerian microsatellite Alsat-1. A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in these commercial memories shows that the typical SEU rate at alsat-1's orbit is 4.04 × 10-7 SEU/bit/day, where 98.6% of these SEUs cause single-bit errors, 1.22% cause double-byte errors, and the remaining SEUs result in multiple-bit and severe errors.

Paper Detail
1142
downloads
8
1565
Development of EPID-based Real time Dose Verification for Dynamic IMRT
Abstract:
An electronic portal image device (EPID) has become a method of patient-specific IMRT dose verification for radiotherapy. Research studies have focused on pre and post-treatment verification, however, there are currently no interventional procedures using EPID dosimetry that measure the dose in real time as a mechanism to ensure that overdoses do not occur and underdoses are detected as soon as is practically possible. As a result, an EPID-based real time dose verification system for dynamic IMRT was developed and was implemented with MATLAB/Simulink. The EPID image acquisition was set to continuous acquisition mode at 1.4 images per second. The system defined the time constraint gap, or execution gap at the image acquisition time, so that every calculation must be completed before the next image capture is completed. In addition, the
Paper Detail
1354
downloads
7
9391
Performance Comparison of Real Time EDAC Systems for Applications On-Board Small Satellites
Authors:
Abstract:
On-board Error Detection and Correction (EDAC) devices aim to secure data transmitted between the central processing unit (CPU) of a satellite onboard computer and its local memory. This paper presents a comparison of the performance of four low complexity EDAC techniques for application in Random Access Memories (RAMs) on-board small satellites. The performance of a newly proposed EDAC architecture is measured and compared with three different EDAC strategies, using the same FPGA technology. A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in commercial memories onboard Alsat-1 is given for a period of 8 years
Paper Detail
1445
downloads
6
8547
Application of Machine Learning Methods to Online Test Error Detection in Semiconductor Test
Abstract:

As in today's semiconductor industries test costs can make up to 50 percent of the total production costs, an efficient test error detection becomes more and more important. In this paper, we present a new machine learning approach to test error detection that should provide a faster recognition of test system faults as well as an improved test error recall. The key idea is to learn a classifier ensemble, detecting typical test error patterns in wafer test results immediately after finishing these tests. Since test error detection has not yet been discussed in the machine learning community, we define central problem-relevant terms and provide an analysis of important domain properties. Finally, we present comparative studies reflecting the failure detection performance of three individual classifiers and three ensemble methods based upon them. As base classifiers we chose a decision tree learner, a support vector machine and a Bayesian network, while the compared ensemble methods were simple and weighted majority vote as well as stacking. For the evaluation, we used cross validation and a specially designed practical simulation. By implementing our approach in a semiconductor test department for the observation of two products, we proofed its practical applicability.

Paper Detail
1223
downloads
5
6858
Program Memories Error Detection and Correction On-Board Earth Observation Satellites
Authors:
Abstract:

Memory Errors Detection and Correction aim to secure the transaction of data between the central processing unit of a satellite onboard computer and its local memory. In this paper, the application of a double-bit error detection and correction method is described and implemented in Field Programmable Gate Array (FPGA) technology. The performance of the proposed EDAC method is measured and compared with two different EDAC devices, using the same FPGA technology. Statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in commercial memories onboard the first Algerian microsatellite Alsat-1 is given.

Paper Detail
1459
downloads
4
7888
Increase of Error Detection Effectiveness in the Data Transmission Channels with Pulse-Amplitude Modulation
Abstract:
In this paper an approaches for increasing the effectiveness of error detection in computer network channels with Pulse-Amplitude Modulation (PAM) has been proposed. Proposed approaches are based on consideration of special feature of errors, which are appearances in line with PAM. The first approach consists of CRC modification specifically for line with PAM. The second approach is base of weighted checksums using. The way for checksum components coding has been developed. It has been shown that proposed checksum modification ensure superior digital data control transformation reliability for channels with PAM in compare to CRC.
Paper Detail
780
downloads
3
926
Decoder Design for a New Single Error Correcting/Double Error Detecting Code
Abstract:
This paper presents the decoder design for the single error correcting and double error detecting code proposed by the authors in an earlier paper. The speed of error detection and correction of a code is largely dependent upon the associated encoder and decoder circuits. The complexity and the speed of such circuits are determined by the number of 1?s in the parity check matrix (PCM). The number of 1?s in the parity check matrix for the code proposed by the authors are fewer than in any currently known single error correcting/double error detecting code. This results in simplified encoding and decoding circuitry for error detection and correction.
Paper Detail
1114
downloads
2
2740
Analysis of Testing and Operational Software Reliability in SRGM based on NHPP
Abstract:
Software Reliability is one of the key factors in the software development process. Software Reliability is estimated using reliability models based on Non Homogenous Poisson Process. In most of the literature the Software Reliability is predicted only in testing phase. So it leads to wrong decision-making concept. In this paper, two Software Reliability concepts, testing and operational phase are studied in detail. Using S-Shaped Software Reliability Growth Model (SRGM) and Exponential SRGM, the testing and operational reliability values are obtained. Finally two reliability values are compared and optimal release time is investigated.
Paper Detail
915
downloads
1
15859
Testing Loaded Programs Using Fault Injection Technique
Abstract:
Fault tolerance is critical in many of today's large computer systems. This paper focuses on improving fault tolerance through testing. Moreover, it concentrates on the memory faults: how to access the editable part of a process memory space and how this part is affected. A special Software Fault Injection Technique (SFIT) is proposed for this purpose. This is done by sequentially scanning the memory of the target process, and trying to edit maximum number of bytes inside that memory. The technique was implemented and tested on a group of programs in software packages such as jet-audio, Notepad, Microsoft Word, Microsoft Excel, and Microsoft Outlook. The results from the test sample process indicate that the size of the scanned area depends on several factors. These factors are: process size, process type, and virtual memory size of the machine under test. The results show that increasing the process size will increase the scanned memory space. They also show that input-output processes have more scanned area size than other processes. Increasing the virtual memory size will also affect the size of the scanned area but to a certain limit.
Paper Detail
1185
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